Smart grid


International Standardization

IEC Challenges

IEC challenges

The IEC recognizes the contribution of the world’s academics, via scientific theory, research and engineering applications, but also as partners who strive to improve processes to achieve their future goals. Two recent global academic paper competitions have seen the best and brightest minds in the field of International Standardization advance scholastic endeavour.

IEC Centenary Challenge

For its centenary in 2006, the IEC invited the academic world to provide its views on the contribution of international standards to society. Participants were asked to address:"Consideration of the economic, business and social impact of the development and use of International Standards for end-users at any level of business activity."

IEC IEEE Challenge 2012

Centred on the theme “How does electrotechnology impact economic, social and environmental development?” the IEC IEEE Challenge invited academics to challenge the perception of electrotechnology and how universal standards influence all spheres of development.

IEC Centenary Challenge papers

pdf document 2.00 MB

Winning papers from the IEC-IEEE-KATS Academic Challenge 2018


1st Prize – New rules for standards-setting and new roles of standardization bodies in the era of IoT


2nd Prize – “Smart” standardisation


3rd Prize – How much standardized is a country?


3rd Prize – Establishing standards for electrical measurement data management in the oil and gas industry


3rd Prize – Standard information as a new indicator to detect industrial changes

pdf document 1.45 MB

Winning papers from the IEC-IEEE Challenge 2012: How does electrotechnology impact economic, social and environmental development?


Ken Krechmer, University of Colorado


Axel Mangelsdorf, (lead author), BAM Federal Institute for Materials, Research and Testing

Knut Blind, co-author, Technical University Berlin, Chair of Innovation Economics


Joyce van de Vegte, Camosun College

pdf document 1.59 MB

Architecture-based approaches to international standardization and evolution of business models

Junjiro Shintaku (lead author); Koichi Ogawa, Tetsuo Yoshimoto (co-authors)

The University of Tokyo - Manufacturing Management Research Center, Japan

pdf document 1.09 MB

Benefits of standardization in the microelectronics industries and their implications on nanotechnology and other innovative industries

Werner Bergholz (lead author); Bettina Weiss, Carlos Lee (co-authors)

International University Bremen, Germany

pdf document 982 kB

Do national standards hinder or promote trade in electrical products?

Johannes Moenius

University of Redlands, USA

pdf document 938 kB

Industrial legislatures: The American system of standardization

Andrew Russell

The Johns Hopkins University, USA

pdf document 1.00 MB

Measuring the performance of standard setting organizations

Timothy S. Simcoe (lead author); Marc Rysman (co-author)

The Joseph L. Rotman School of Management

University of Toronto, Canada

pdf document 911 kB

Standardization and business development: The global impact of the IOSA standards and the value of anticipation

David Hodgkinson

The University of Western Australia, Australia

pdf document 1.16 MB

Standardization and patent pools: Using patent licensing to lead the market

Hajime Yamada

Toyo University, Japan

pdf document 1.20 MB

Standardizing mesopic vision conditions and incidence on light sources science and technology

Georges Zissis (lead author); Stuart Mucklejohn (co-author)

Université Paul Sabatier – Toulouse III, France, Laboratoire des Plasmas et de Conversion de l'Energie - Team 'Sources Intenses des Photons'

pdf document 932 kB

Standards for business - How companies benefit from participation in international standards setting Henk J. de Vries

RSM Erasmus University, The Netherlands

pdf document 1.19 MB

The entrepreneur and standards

Ken Krechmer (lead author); Elaine Baskin (co-author)

University of Colorado at Boulder, USA

pdf document 980 kB

The impacts of ICT standards: Three views

Knut Blind

Fraunhofer ISI, Technische Universität Berlin, Germany